EEE-Net: Efficient Edge Enhanced Network for Surface Defect Detection of Glass-Reference-Cited by-同舟云学术

EEE-Net: Efficient Edge Enhanced Network for Surface Defect Detection of Glass

Author:

Chen Yongqi¹^ORCID,Pan Jiawei²^ORCID,Lei Jiayu³^ORCID,Zeng Deyu⁴^ORCID,Wu Zongze⁵^ORCID,Chen Changsheng¹^ORCID

Affiliation:

1. Guangdong Key Laboratory of Intelligent Information Processing and Shenzhen Key Laboratory of Media Security, Shenzhen University, Shenzhen, China

2. School of Automation, Guangdong University of Technology, Guangzhou, China

3. Meizhou Academy of Medical Sciences, Meizhou, China

4. College of Mechatronics and Control Engineering and the College of Computer Science and Software Engineering, Shenzhen University, Shenzhen, China

5. College of Mechatronics and Control Engineering, Shenzhen University, Shenzhen, China

Funder

Grants of the National Key Research and Development Program of China

Shenzhen University 2035 Program for Excellent Research

Open Research Fund from Guangdong Laboratory of Artificial Intelligence and Digital Economy

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

Reference46 articles.

1. Visual saliency based on multiscale deep features;li;Proc IEEE Conf Comput Vis Pattern Recognit (CVPR),2015

2. Convolutional sequence to sequence learning;gehring;Proc Int Conf Mach Learn (ICML),2017

3. Deep learning;lecun;Nature,2015

5. An image is worth 16?16 words: Transformers for image recognition at scale;dosovitskiy;Proc Int Conf Learn Represent (ICLR),2021

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献