Illumination-Insensitive Binary Descriptor for Visual Measurement Based on Local Inter-Patch Invariance-Reference-Cited by-同舟云学术

Illumination-Insensitive Binary Descriptor for Visual Measurement Based on Local Inter-Patch Invariance

Published:2023 Issue: Volume:72 Page:1-13
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Lin Xinyu¹^ORCID,Zhou Yingjie²^ORCID,Zhang Xun³^ORCID,Liu Yipeng¹^ORCID,Zhu Ce¹^ORCID

Affiliation:

1. Laboratory of Advanced Visual Communications and Computing, School of Information and Communication Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, China

2. College of Computer Science, Sichuan University, Chengdu, China

3. institut superieur d’electronique de Paris—ISEP, Paris, France

Funder

National Natural Science Foundation of China

Sichuan Science and Technology Program

111 Project

EU Horizon 2020 program towards the 6G BRAINS project

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/10012124/10119235.pdf?arnumber=10119235

Reference53 articles.

1. BEBLID: Boosted efficient binary local image descriptor

2. Fast Explicit Diffusion for Accelerated Features in Nonlinear Scale Spaces

3. BRISK: Binary Robust invariant scalable keypoints

4. BRIEF: Binary Robust Independent Elementary Features

5. Image Matching Across Wide Baselines: From Paper to Practice

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