SiC CMOS Gate Driver for High-Temperature Aerospace Applications-Reference-Cited by-同舟云学术

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SiC CMOS Gate Driver for High-Temperature Aerospace Applications

Published:2024-03-07 Issue: Volume: Page:99-102
ISSN:
Container-title:2024 Argentine Conference on Electronics (CAE)
language:
Short-container-title:

Author:

Torres Felipe¹,Martínez Andrés¹,Marín Jorge¹,Rojas Christian A.¹,Gak Joel²,Rommel Mathias³,Wilson-Veas Alan H.¹,May Alexander³,Schraml Michael³,Calarco Nicolás²,Miguez Matías²

Affiliation:

1. Universidad Técnica Federico Santa María,Department of Electronic Eng.,Valparaiso,Chile

2. Universidad Católica del Uruguay,Engineering Department,Montevideo,Uruguay

3. Fraunhofer Institute for Integrated Systems and Device Technology IISB,Erlangen,Germany

Funder

ANII

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10487127/10487112/10487149.pdf?arnumber=10487149

Reference20 articles.

1. Definition of New Space—Expert Survey Results and Key Technology Trends

2. Toward a Definition of New Space? The Entrepreneurial Perspective

3. Prototyping and characterization of radiation hardened SiC MOS structures

4. Silicon carbide MEMS for harsh environments

5. Silicon Carbide Microsystems for Harsh Environments

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