Optimal focal plane analysis research using noise caused by depth of field of objective lens in digital holographic microscopy (DHM)-Reference-Cited by-同舟云学术

Optimal focal plane analysis research using noise caused by depth of field of objective lens in digital holographic microscopy (DHM)

Published:2022-07-05 Issue: Volume: Page:
ISSN:
Container-title:2022 37th International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC)
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Author:

Kim Hyun-Woo¹,Cho Myungjin²,Huh Jong-Hoon³,Lee Min-Chul¹

Affiliation:

1. Kyushu Institute of Technology,Department of Computer Science and Networks,Iizuka-shi, Fukuoka,Japan

2. School of ICT, Robotics, and Mechanical Engineering, IITC, Hankyong National University,Anseong,Kyonggi-do,Republic of Korea

3. Kyushu Institute of Technology,Department of Physics and Information Technology,Iizuka-shi, Fukuoka,Japan

Funder

National Research Foundation of Korea

Publisher

IEEE

Link

Reference8 articles.

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1. A Novel Noise Filtering Method Using Kalman Filter in Digital Holographic Microscopy (DHM);2024 International Technical Conference on Circuits/Systems, Computers, and Communications (ITC-CSCC);2024-07-02

2. A Study on Coherence Length and Interferometry in Digital Holographic Microscopy;2023 23rd International Conference on Control, Automation and Systems (ICCAS);2023-10-17