A Time-Efficient Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits
Author:
Affiliation:
1. Iowa State University,Department of Electrical and Computer Engineering,Iowa,USA
Funder
Semiconductor Research Corporation
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9893151/9893215/09893224.pdf?arnumber=9893224
Reference13 articles.
1. Practical random sampling of potential defects for analog fault simulation
2. Robust DfT Techniques for Built-in Fault Detection in Operational Amplifiers with High Coverage
3. Oscillation-test strategy for analog and mixed-signal integrated circuits
4. Testing analog and mixed-signal integrated circuits using oscillation-test method
5. Efficient Analog Defect Simulation
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1. A Power Supply Rejection Based Approach for Robust Defect Detection in Operational Amplifiers;2023 IEEE East-West Design & Test Symposium (EWDTS);2023-09-22
2. Graph Theory Based Defect Simulation Framework for Analog and Mixed Signal (AMS) Circuits with Improved Time-Efficiency;2023 IEEE East-West Design & Test Symposium (EWDTS);2023-09-22
3. Digital Assisted Defect Detection Methods for Analog and Mixed Signal Circuits: An Overview;2023 IEEE East-West Design & Test Symposium (EWDTS);2023-09-22
4. Low-cost defect simulation framework for analog and mixed signal (AMS) circuits with enhanced time-efficiency;Analog Integrated Circuits and Signal Processing;2023-07-13
5. Defect Detection and Localization in Operational Amplifiers using Digital Control and Monitor Circuits;2023-05-11
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