Evaluation of Deep Learning Model for Detecting Electronic Components in Few-Shot Learning Scenarios-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Evaluation of Deep Learning Model for Detecting Electronic Components in Few-Shot Learning Scenarios

Published:2023-10-29 Issue: Volume: Page:1-6
ISSN:
Container-title:2023 IEEE Latin American Conference on Computational Intelligence (LA-CCI)
language:
Short-container-title:

Author:

Rocha Allana¹,Fernandes Bruno¹,Honorato Leandro¹

Affiliation:

1. Universidade de Pernambuco,Escola Politécnica de Pernambuco,Recife,Brasil

Funder

Coordenação de Aperfeiçoamento de Pessoal de Nível Superior

Conselho Nacional de Desenvolvimento Científico e Tecnológico

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10409226/10409302/10409312.pdf?arnumber=10409312

Reference28 articles.

1. A Mini‐Review of E‐Waste Management in Brazil: Perspectives and Challenges

2. Experimental determination of the constitutional heterogeneity for sampling of waste printed circuit boards

3. Electronic Waste Management: Challenges and Opportunities

4. Recycling of waste printed circuit boards: A review of current technologies and treatment status in China

5. E-waste: An assessment of global production and environmental impacts

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP