Test Event Generation for a Fall-Detection IoT System-Reference-Cited by-同舟云学术

Test Event Generation for a Fall-Detection IoT System

Published:2019-08 Issue:4 Volume:6 Page:6642-6651
ISSN:2327-4662
Container-title:IEEE Internet of Things Journal
language:
Short-container-title:IEEE Internet Things J.

Author:

Gutierrez-Madronal Lorena^ORCID,La Blunda Luigi^ORCID,Wagner Matthias F.^ORCID,Medina-Bulo Inmaculada^ORCID

Funder

Ministry of Economy and Competitiveness (Spain) and the FEDER Fund, through the National Program for Research, Development and Innovation, Societal Challenges Oriented, Project DArDOS

Program of Development and Impulse of Research Activity of the University of Cadiz

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computer Networks and Communications,Computer Science Applications,Hardware and Architecture,Information Systems,Signal Processing

Link

http://xplorestaging.ieee.org/ielx7/6488907/8784345/08681553.pdf?arnumber=8681553

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