1. An Efficient Time-Tick based BIST Scheme to Calculate Static Errors of ADC;2023 International Conference on Intelligent Technologies for Sustainable Electric and Communications Systems (iTech SECOM);2023-12-18
2. On-chip Self-test Solutions for ADC survey and analysis;2023 IEEE 8th International Conference on Recent Advances and Innovations in Engineering (ICRAIE);2023-12-02
3. Low Distortion Sinusoidal Signal Generator with Harmonics Cancellation Using Two Types of Digital Predistortion;2023 IEEE International Test Conference (ITC);2023-10-07
4. New Algorithm for Fast and Accurate Linearity Testing of High-Resolution SAR ADCs;2023 IEEE International Test Conference (ITC);2023-10-07