Open-Circuit Fault Diagnosis Method for Grid-Tied T-Type Converters Based on Harr-Like Features
Author:
Affiliation:
1. Key Laboratory of Imaging Processing and Intelligence Control, School of Artificial Intelligence and Automation, Huazhong University of Science and Technology, Wuhan, China
2. Easy Group Company Ltd., Dongguan, China
Funder
National Natural Science Foundation of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Link
http://xplorestaging.ieee.org/ielx7/6245517/10621840/10517527.pdf?arnumber=10517527
Reference35 articles.
1. A Review of Single-Stage Multiport Inverters for Multisource Applications
2. Design and Implementation of a Highly Efficient Three-Level T-Type Converter for Low-Voltage Applications
3. The Benefits of SiC mosfets in a T-Type Inverter for Grid-Tie Applications
4. Design of a High-Efficiency, High Specific-Power Three-Level T-Type Power Electronics Building Block for Aircraft Electric-Propulsion Drives
5. Toward Reliable Power Electronics: Challenges, Design Tools, and Opportunities
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