Load Current Injection Modes Affected Power Cycling Lifetime and Failure Mechanism of IGBTs-Reference-Cited by-同舟云学术

Load Current Injection Modes Affected Power Cycling Lifetime and Failure Mechanism of IGBTs

Published:2023-06 Issue:3 Volume:11 Page:3525-3534
ISSN:2168-6777
Container-title:IEEE Journal of Emerging and Selected Topics in Power Electronics
language:
Short-container-title:IEEE J. Emerg. Sel. Topics Power Electron.

Author:

Deng Erping¹^ORCID,Xie Luhong²^ORCID,Wu Lixin²^ORCID,Cao Haiyang³,Pan Maoyang²,Zhang Ying²^ORCID,Yan Yuxing²,Huang Yongzhang²,Ding Lijian¹^ORCID

Affiliation:

1. School of Electric Engineering and Automation, Hefei University of Technology, Hefei, China

2. State Key Laboratory of Alternate Electrical Power System with Renewable Energy Sources, North China Electric Power University, Beijing, China

3. Shanghai XPT Technology Ltd., Shanghai, China

Funder

National Natural Science Foundation of China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Energy Engineering and Power Technology

Link

Reference29 articles.

2. Investigations on the VCE(T)-method to determine the junction temperature by using the chip itself as sensor;scheuermann;Proc PCIM Eur,2009

3. A simple and accurate method to measure the threshold voltage of an enhancement-mode MOSFET;lee;IEEE Trans Electron Devices,1982

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