Data retention in MLC NAND flash memory: Characterization, optimization, and recovery

Author:

Cai Yu,Luo Yixin,Haratsch Erich F.,Mai Ken,Mutlu Onur

Publisher

IEEE

Cited by 178 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Deep Transfer Learning-Based Detection for Flash Memory Channels;IEEE Transactions on Communications;2024-06

2. Achieving Near-Zero Read Retry for 3D NAND Flash Memory;Proceedings of the 29th ACM International Conference on Architectural Support for Programming Languages and Operating Systems, Volume 2;2024-04-27

3. Sequential Decoders for Binary Linear Block ECCs;2024 IEEE 42nd VLSI Test Symposium (VTS);2024-04-22

4. Modeling of Post-Cycling Retention Bake in 3-D CTF TLC NAND Arrays;2024 IEEE International Reliability Physics Symposium (IRPS);2024-04-14

5. RiF: Improving Read Performance of Modern SSDs Using an On-Die Early-Retry Engine;2024 IEEE International Symposium on High-Performance Computer Architecture (HPCA);2024-03-02

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