1-kb FinFET Dielectric Resistive Random Access Memory Array in $1\times $ nm CMOS Logic Technology for Embedded Nonvolatile Memory Applications
Author:
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/16/7592488/07587361.pdf?arnumber=7587361
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Investigation of oxygen deficiency-rich/oxygen deficiency-poor stacked TiO2 based resistive random access memory by mist chemical vapor deposition;Ceramics International;2022-10
2. Realizing forming-free characteristic by doping Ag into HfO2-based RRAM;Applied Physics Express;2021-03-26
3. MoS 2 /Polymer Heterostructures Enabling Stable Resistive Switching and Multistate Randomness;Advanced Materials;2020-08-26
4. Investigation on High-κ Dielectric for Low Leakage AlGaN/GaN MIS-HEMT Device, Using Material Selection Methodologies;Semiconductors;2018-04
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