Performance and Reliability of 12.5-Gb/s Oxide-Free 850-nm Mesa VCSELs-Reference-Cited by-同舟云学术

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Performance and Reliability of 12.5-Gb/s Oxide-Free 850-nm Mesa VCSELs

Published:2008 Issue:3 Volume:44 Page:226-231
ISSN:0018-9197
Container-title:IEEE Journal of Quantum Electronics
language:
Short-container-title:IEEE J. Quantum Electron.

Author:

Murty M. V. Ramana,Chirovsky Leo M. F.,Hu Syn-Yem,Venables David,Cheng Michael,Ciesla Craig M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Link

http://xplorestaging.ieee.org/ielx5/3/4446030/04446037.pdf?arnumber=4446037

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. 1550-nm wavelength-tunable HCG VCSELs;SPIE Proceedings;2014-02-19

2. Tunable 1550nm VCSELs using high-contrast grating for next-generation networks;Optical Metro Networks and Short-Haul Systems VI;2013-12-20

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