Class-constrained t-SNE: Combining Data Features and Class Probabilities

Author:

Meng Linhao1,Elzen Stef van den1,Pezzotti Nicola1,Vilanova Anna1

Affiliation:

1. Eindhoven University of Technology, Netherlands

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computer Graphics and Computer-Aided Design,Computer Vision and Pattern Recognition,Signal Processing,Software

Reference60 articles.

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