Positive-Sample-Based Surface Defect Detection Using Memory-Augmented Adversarial Autoencoders-Reference-Cited by-同舟云学术

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Positive-Sample-Based Surface Defect Detection Using Memory-Augmented Adversarial Autoencoders

Published:2021 Issue: Volume: Page:1-1
ISSN:1083-4435
Container-title:IEEE/ASME Transactions on Mechatronics
language:
Short-container-title:IEEE/ASME Trans. Mechatron.

Author:

Niu Tongzhi¹,Li Bin²,Li Weifeng³,Qiu Yuanhong⁴,Niu Shuanlong⁵

Affiliation:

1. Huazhong University of Science and Technology, 12443 Wuhan, China, 430074 (e-mail: tzniu@hust.edu.cn)

2. Huazhong University of Science and Technology, 12443 Wuhan, Hubei, China, 430074 (e-mail: libin999@hust.edu.cn)

3. Huazhong University of Science and Technology, 12443 Wuhan, Hubei, China, 430074 (e-mail: liweifeng@hust.edu.cn)

4. Huazhong University of Science and Technology, 12443 Wuhan, Hubei, China, 430074 (e-mail: d201780188@hust.edu.cn)

5. Huazhong University of Science and Technology, 12443 Wuhan, Hubei, China, 430074 (e-mail: d201780187@hust.edu.cn)

Funder

the National Key RD Program of China

the Fundamental Research Funds for the Central University

the Key RD Program of Hubei China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx7/3516/4785241/09351664.pdf?arnumber=9351664

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