Application of a New Inversion Algorithm Based on Multi-Layer Model Hypothesis for Testing Stress-Depth Profiles by Multi-Frequency EC Method
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Published:2021-05
Issue:5
Volume:57
Page:1-9
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ISSN:0018-9464
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Container-title:IEEE Transactions on Magnetics
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language:
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Short-container-title:IEEE Trans. Magn.
Author:
Di Jingyu,He Cunfu,Lee Yung-Chun,Liu Xiucheng,Shang Wanli
Funder
National Natural Science Foundation of China
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials