Global Sensitivity Analysis Using a Kriging Metamodel for EM Design Problems With Functional Outputs-Reference-Cited by-同舟云学术

Global Sensitivity Analysis Using a Kriging Metamodel for EM Design Problems With Functional Outputs

Published:2022-09 Issue:9 Volume:58 Page:1-4
ISSN:0018-9464
Container-title:IEEE Transactions on Magnetics
language:
Short-container-title:IEEE Trans. Magn.

Author:

Bingler Arnold¹^ORCID,Bilicz Sandor¹^ORCID,Csornyei Mark²^ORCID

Affiliation:

1. Department of Broadband Infocommunications and Electromagnetic Theory, Faculty of Electrical Engineering and Informatics, Budapest University of Technology and Economics, Budapest, Hungary

2. Robert Bosch Kft., Budapest, Hungary

Funder

Hungarian Scientific Research Fund

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/20/9868170/09756540.pdf?arnumber=9756540

Reference12 articles.

1. Variability Impact of Many Design Parameters: The Case of a Realistic Electronic Link

2. Reliability and Sensitivity Analysis of Transmission Lines in a Probabilistic EMC Context

3. High-Frequency Model of the Coupled Inductors Used in EMI Filters

4. Global sensitivity analysis in the context of imprecise probabilities (p-boxes) using sparse polynomial chaos expansions

5. An improved approximation to the precision of fixed effects from restricted maximum likelihood

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