Magnetic Layer Thickness Influence on Magnetoelastic Properties Anisotropy in Co2Fe0.4Mn0.6Si Heusler Alloy Thin Films
Author:
Affiliation:
1. Institute of Physics, Polish Academy of Sciences, Warsaw, Poland
2. Institute for Materials Research, Tohoku University, Sendai, Japan
Funder
National Science Centre of Poland
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/20/10294220/10155193.pdf?arnumber=10155193
Reference18 articles.
1. Anisotropy of magnetoelastic properties in epitaxial Co2FexMn1?xSi Heusler alloy thin films;nabia?ek;Phys Rev B Condens Matter,2022
2. Magnetoelastic Properties of Epitaxially Grown Co2Fe0.4Mn0.6Si and Co2FeGa0.5Ge0.5Heusler Alloys Thin Films
3. Ultrafast demagnetization mechanism in half-metallic Heusler alloy thin films controlled by the Fermi level
4. Role of the Cr Buffer Layer in the Thickness-Dependent Ultrafast Magnetization Dynamics of Co2Fe0.4Mn0.6Si Heusler Alloy Thin Films
5. Thin film’s magnetostriction investigated by strain modulated ferromagnetic resonance at low temperature
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1. Magnetoelastic coupling for Fe–Ga thin films epitaxially grown on different substrates;Journal of Physics D: Applied Physics;2024-06-28
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