Novel Method to Measure Common Mode Transient Immunity of Isolators-Reference-Cited by-同舟云学术

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Novel Method to Measure Common Mode Transient Immunity of Isolators

Published:2022-05-23 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE European Test Symposium (ETS)
language:
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Author:

Thouabtia Mohamed¹,Oleszczuk Alexander¹,Girg Thomas²,Allinger Martin¹

Affiliation:

1. Verification and Test eesy-ic GmbH,Erlangen,Germany

2. RF Design eesy-ic GmbH,Erlangen,Germany

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/9810327/9810358/09810401.pdf?arnumber=9810401

Reference5 articles.

1. Common Mode Transient Immunity (CMTI) for UCC2122x Isolated Gate Drivers;zhang;Texas Instruments Application Report,2018

2. DIN VDE V 0884 - 11 * German Language Version * Halbleit-erbauelemente Magnetische und kapazitive Koppler für Basisisolierung und verstärkte Isolierung;VDE Standard VDE Art No 0800375,2017

3. Changing The Paradigm In Common Mode Transient Immunity (CMTI) Testing Of Dual Channel Galvanically Isolated Gate Drivers

4. Linear Circuit Design Handbook;zumbahlen,0

5. Digital isolators offer performance advantages in industrial motor drive applications;briano,2012

Cited by 1 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. CMTI Improvement Circuit for SiC MOSFET Isolated Gate Driver;2023 4th International Conference on Advanced Electrical and Energy Systems (AEES);2023-12-01

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