Design of a New Microcontroller-Based Vernier Fringe Counter for Interferometric Measurement of Laser Wavelength-Reference-Cited by-同舟云学术

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Design of a New Microcontroller-Based Vernier Fringe Counter for Interferometric Measurement of Laser Wavelength

Published:2016-02 Issue:2 Volume:65 Page:407-412
ISSN:0018-9456
Container-title:IEEE Transactions on Instrumentation and Measurement
language:
Short-container-title:IEEE Trans. Instrum. Meas.

Author:

Diz-Bugarin Javier,Outumuro-Gonzalez Ismael,Vazquez-Dorrio Jose Benito,Valencia-Alvarez Jose Luis,Blanco-Garcia Jesus

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Instrumentation

Link

http://xplorestaging.ieee.org/ielx7/19/7370751/7296665.pdf?arnumber=7296665

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. New electronic implementation of the timestamps method intended for high resolution comparison of laser wavelengths;Review of Scientific Instruments;2023-09-01

2. Analysis of Network Loss Influence Characteristics of Distribution Network with Different Types of DG;Lecture Notes in Electrical Engineering;2023

3. A Calibration Scheme With Combination of the Optical Shaft Encoder and Laser Triangulation Sensor for Low-Frequency Angular Acceleration Rotary Table;IEEE Transactions on Instrumentation and Measurement;2021

4. Wavemeter improvements for laser diode calibration;Third International Conference on Applications of Optics and Photonics;2017-08-22

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