Statistical Modeling and Reliability Analysis for Degradation Processes Indexed by Two Scales-Reference-Cited by-同舟云学术

Statistical Modeling and Reliability Analysis for Degradation Processes Indexed by Two Scales

Published:2023 Issue: Volume: Page:1-10
ISSN:1551-3203
Container-title:IEEE Transactions on Industrial Informatics
language:
Short-container-title:IEEE Trans. Ind. Inf.

Author:

Zhai Qingqing¹^ORCID,Xu Ancha²^ORCID,Yang Jun³^ORCID,Zhou Yijing¹^ORCID

Affiliation:

1. School of Management, Shanghai University, Shanghai, China

2. Department of Statistics, Collaborative Innovation Center of Statistical Data Engineering, Technology & Application, Zhejiang Gongshang University, Hangzhou, China

3. School of Reliability and Systems Engineering, Beihang University, Beijing, China

Funder

National Natural Science Foundation of China

China Scholarship Council

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Information Systems,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx7/9424/4389054/10255293.pdf?arnumber=10255293

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