Weakly Supervised End-to-End Learning for Inspection on Multidirectional Integrated Circuit Markings in Surface Mount Technology-Reference-Cited by-同舟云学术

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Weakly Supervised End-to-End Learning for Inspection on Multidirectional Integrated Circuit Markings in Surface Mount Technology

Published:2023 Issue: Volume: Page:1-11
ISSN:1551-3203
Container-title:IEEE Transactions on Industrial Informatics
language:
Short-container-title:IEEE Trans. Ind. Inf.

Author:

Chen Zhongshu¹^ORCID,Zuo Lin²^ORCID,Guo Feng³^ORCID,Zhang Changhua¹^ORCID,Liu Yu⁴^ORCID

Affiliation:

1. School of Mechanical and Electrical Engineering, University of Electronic Science and Technology of China, Chengdu, China

2. School of Information and Software Engineering, University of Electronic Science and Technology of China, Chengdu, China

3. School of Computer Science and Engineering, University of Electronic Science and Technology of China, Chengdu, China

4. School of Mechanical and Electrical Engineering, Center for System Reliability and Safety, University of Electronic Science and Technology of China, Chengdu, China

Funder

National Natural Science Foundation of China

Sichuan Science and Technology Program

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Information Systems,Control and Systems Engineering

Link

http://xplorestaging.ieee.org/ielx7/9424/4389054/10219142.pdf?arnumber=10219142

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