Vertices Packaging-Based Interval Independent Component Analysis (VP-I<sup>2</sup>CA) for Fault Detection With Process Uncertainty-Reference-Cited by-同舟云学术

Vertices Packaging-Based Interval Independent Component Analysis (VP-I²CA) for Fault Detection With Process Uncertainty

Author:

Zhang Shumei¹^ORCID,Wang Sijia²^ORCID,Zhao Chunhui³^ORCID

Affiliation:

1. Tianjin Key Laboratory of Process Measurement and Control, School of Electrical and Information Engineering, Tianjin University, Tianjin, China

2. School of Electrical and Information Engineering, Tianjin University, Tianjin, China

3. State Key Laboratory of Industrial Control Technology, College of Control Science and Engineering, Zhejiang University, Hangzhou, China

Funder

National Natural Science Foundation of China

Natural Science Foundation of Tianjin, China

Open Research Project of the State Key Laboratory of Industrial Control Technology, Zhejiang University, China

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Computer Science Applications,Information Systems,Control and Systems Engineering

Link

Reference29 articles.

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