DEFCON: Defect Acceleration through Content Optimization
Author:
Affiliation:
1. Intel Corporation,Santa Clara,CA,USA
2. Intel Corporation,Hillsboro,OR,USA
Publisher
IEEE
Link
http://xplorestaging.ieee.org/ielx7/9983856/9983857/09983903.pdf?arnumber=9983903
Reference31 articles.
1. Early-life-failure detection using SAT-based ATPG
2. Detection of early-life failures in high-K metal-gate transistors and ultra low-K inter-metal dielectrics
3. Temperature and field interrelation study of low-k TDDB for Cu interconnects with and without liner - New insights to the roles of Cu for a competing breakdown process
4. On-chip diagnosis for early-life and wear-out failures
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