Author:
Benso A.,Di Carlo S.,Di Natale G.,Prinetto P.
Cited by
16 articles.
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1. Automated Fault Analyzer for March Algorithm Dynamic Fault Detection Analysis;2022 IEEE 20th Student Conference on Research and Development (SCOReD);2022-11-08
2. Fault-coverage Maximizing March Tests for Memory Testing;2022 IEEE International Test Conference (ITC);2022-09
3. Iterative Diagnosis Approach for ECC-Based Memory Repair;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2020-02
4. On the in-field test of the GPGPU scheduler memory;2019 IEEE 22nd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS);2019-04
5. A Heuristic Algorithm for Automatic Generation of March Tests;2017 IEEE 26th Asian Test Symposium (ATS);2017-11