Bayes estimation of component-reliability from masked system-life data-Reference-Cited by-同舟云学术

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Bayes estimation of component-reliability from masked system-life data

Published:1996-06 Issue:2 Volume:45 Page:233-237
ISSN:0018-9529
Container-title:IEEE Transactions on Reliability
language:
Short-container-title:IEEE Trans. Rel.

Author:

Lin D.K.J.,Usher J.S.,Guess F.M.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Safety, Risk, Reliability and Quality

Link

http://xplorestaging.ieee.org/ielx1/24/11060/00510807.pdf?arnumber=510807

Cited by 47 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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3. An integrated approach to estimate storage reliability with masked data from series system;Eksploatacja i Niezawodność – Maintenance and Reliability;2023-10-01

4. Parameter Estimation Based on Censored Data under Partially Accelerated Life Testing for Hybrid Systems due to Unknown Failure Causes;Computer Modeling in Engineering & Sciences;2022

5. Bayesian competing risk analysis: An application to nasopharyngeal carcinoma patients data;Computational and Systems Oncology;2021-01-03

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