DC-YOLO: Improved YOLOv7 Based on Deformable Convolution and Attention Mechanism for Fabric Defect Detection-Reference-Cited by-同舟云学术

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DC-YOLO: Improved YOLOv7 Based on Deformable Convolution and Attention Mechanism for Fabric Defect Detection

Published:2023-12-18 Issue: Volume:43 Page:162-167
ISSN:
Container-title:2023 Eleventh International Conference on Advanced Cloud and Big Data (CBD)
language:
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Author:

Ye Kangrui¹,Gao Yuan²,Ye Xiaoxiao³,Ye Ansheng⁴

Affiliation:

1. Tianjin University,College of Intelligence and Computing,Tianjin,China

2. Hainan University,School of Computer Science and Technology,Haikou,China

3. Wuhan University,School of Electronic Information,Wuhan,China

4. Chengdu University,College of Computer Science,Chengdu,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10516322/10516324/10516533.pdf?arnumber=10516533

Reference24 articles.

1. Multi region attention for fine-grained image classification [J];Huanzheng;Journal of Textile Research,2022

2. Towel fabric defect detection based on frequency domain analysis [J];Zhuyi;Computer measurement and control,2020

3. Intelligent segmentation of jacquard warp-knitted fabric using a multiresolution Markov random field with adaptive weighting in the wavelet domain

4. ImageNet classification with deep convolutional neural networks

5. Very deep convolutional networks for large-scale image recognition[J];Simonyan,2014

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