Detection of Electromagnetic Interference in Microcontrollers Using the Instability of an Embedded Phase-Lock Loop-Reference-Cited by-同舟云学术

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Detection of Electromagnetic Interference in Microcontrollers Using the Instability of an Embedded Phase-Lock Loop

Published:2012 Issue: Volume: Page:1-8
ISSN:0018-9375
Container-title:IEEE Transactions on Electromagnetic Compatibility
language:
Short-container-title:IEEE Trans. Electromagn. Compat.

Author:

Yuan Shih-Yi,Wu Yu-Lun,Perdriau Richard,Liao Shry-Sann

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Link

http://xplorestaging.ieee.org/ielx5/15/6497105/06341069.pdf?arnumber=6341069

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