SNR Analysis and Optimization in Near-Field Scanning and EMI Applications-Reference-Cited by-同舟云学术

SNR Analysis and Optimization in Near-Field Scanning and EMI Applications

Published:2018-08 Issue:4 Volume:60 Page:1087-1094
ISSN:0018-9375
Container-title:IEEE Transactions on Electromagnetic Compatibility
language:
Short-container-title:IEEE Trans. Electromagn. Compat.

Author:

Maghlakelidze Giorgi^ORCID,Yan Xin^ORCID,Guan Li^ORCID,Marathe Shubhankar^ORCID,Huang Qiaolei^ORCID,Bae Bumhee,Hwang Chulsoon^ORCID,Khilkevich Victor,Fan Jun^ORCID,Pommerenke David^ORCID

Funder

National Science Foundation

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Link

http://ieeexplore.ieee.org/ielaam/15/8302344/8278226-aam.pdf

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4. Spectrum Analyzer-Based Phase Measurement for Near-Field EMI Scanning;IEEE Transactions on Electromagnetic Compatibility;2020-06

5. Linear Dynamic Range Analysis of the Circuit in EMI Near-Field Scanning System;2019 International Conference on Microwave and Millimeter Wave Technology (ICMMT);2019-05