Far-Field Prediction Using Only Magnetic Near-Field Scanning for EMI Test

Author:

Gao Xu,Fan Jun,Zhang Yaojiang,Kajbaf Hamed,Pommerenke David

Funder

National Science Foundation (NSF)

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

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4. Application of Frequency-Domain Noise-Source Model to Simulation of Time-Synchronized Near-Magnetic-Field Distribution above a Power Circuit;IEEJ Journal of Industry Applications;2024-01-01

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