Automated Line-Based Sequential Sampling and Modeling Algorithm for EMC Near-Field Scanning-Reference-Cited by-同舟云学术

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Automated Line-Based Sequential Sampling and Modeling Algorithm for EMC Near-Field Scanning

Published:2017-04 Issue:2 Volume:59 Page:704-709
ISSN:0018-9375
Container-title:IEEE Transactions on Electromagnetic Compatibility
language:
Short-container-title:IEEE Trans. Electromagn. Compat.

Author:

Singh Prashant,Claeys Tim,Vandenbosch Guy A. E.,Pissoort Davy

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Condensed Matter Physics,Atomic and Molecular Physics, and Optics

Link

http://xplorestaging.ieee.org/ielx7/15/7835246/07776759.pdf?arnumber=7776759

Cited by 10 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Research on a Two-stage Plane Adaptive Sampling Algorithm for Near-field Scanning Acceleration;The Applied Computational Electromagnetics Society Journal (ACES);2024-02-01

2. Progressive Expansion Sampling of Quasi-Static Magnetic Fields in Unconfined Regions;IEEE Transactions on Components, Packaging and Manufacturing Technology;2023-10

3. One Framework to Rule Them All? Framework for Testing Different Sampling Methods for Characterizing the EM Fields in a Scenario;2023 International Symposium on Electromagnetic Compatibility – EMC Europe;2023-09-04

4. Active Expansion Sampling of Magnetic Near-Fields in Unbounded Regions;2022 IEEE 26th Workshop on Signal and Power Integrity (SPI);2022-05-22

5. An Adaptive Sampling Strategy Based on Region Growing for Near-Field-Based Imaging of Radiation Sources;IEEE Access;2021

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