Security and Approximation: Vulnerabilities in Approximation-Aware Testing-Reference-Cited by-同舟云学术

Security and Approximation: Vulnerabilities in Approximation-Aware Testing

Published:2023-01-01 Issue:1 Volume:11 Page:265-271
ISSN:2168-6750
Container-title:IEEE Transactions on Emerging Topics in Computing
language:
Short-container-title:IEEE Trans. Emerg. Topics Comput.

Author:

Dou Yuqin¹,Gu Chongyan²^ORCID,Wang Chenghua¹,Liu Weiqiang¹^ORCID,Lombardi Fabrizio³^ORCID

Affiliation:

1. College of Electronic and Information Engineering, Nanjing University of Aeronautics and Astronautics (NUAA), Nanjing, Jiangsu, China

2. Centre for Secure Information Technologies (CSIT), Institute of Electronics, Communications & Information Technology (ECIT), Queen's University Belfast (QUB), Belfast, U.K.

3. Department of Electrical and Computer Engineering, Northeastern University, Boston, Boston, MA, USA

Funder

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

Royal Society Research

Engineering and Physical Sciences Research Council

EPSRC Quantum Communications Hub

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Computer Science Applications,Human-Computer Interaction,Information Systems,Computer Science (miscellaneous)

Link

http://xplorestaging.ieee.org/ielx7/6245516/10058698/09782726.pdf?arnumber=9782726

Reference19 articles.

1. A Test Pattern Generation Technique for Approximate Circuits Based on an ILP-Formulated Pattern Selection Procedure

2. New Metrics for the Reliability of Approximate and Probabilistic Adders

3. Proof-Carrying Hardware Intellectual Property: A Pathway to Trusted Module Acquisition

4. Testing approximate digital circuits: Challenges and opportunities

5. On the (In)security of approximate computing synthesis;islam,2019

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1. ENAP: An Efficient Number-Aware Pruning Framework for Design Space Exploration of Approximate Configurations;IEEE Transactions on Circuits and Systems I: Regular Papers;2023-05

2. FPAX: A Fast Prior Knowledge-Based Framework for DSE in Approximate Configurations;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023