Volume and quality impacts on reliability: a new game for GaAs-Reference-Cited by-同舟云学术

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Volume and quality impacts on reliability: a new game for GaAs

Published: Issue: Volume: Page:
ISSN:
Container-title:2000 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.00TH8513)
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Author:

Roesch W.J.

Publisher

JEDEC Solid State Technol. Assoc

Link

http://xplorestaging.ieee.org/ielx5/7233/19517/00902426.pdf?arnumber=902426

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Applied Engineering on Physics‐of‐Healthy and SHM of Microelectronic Equipment for Aeronautic, Space, Automotive and Transport Operations;Reliability and Physics‐of‐Healthy in Mechatronics;2022-12-09

2. High-electric-field effects and degradation of AlGaAs/GaAs power HFETs: a numerical study;Microelectronics Reliability;2002-01

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