Understanding Light- and Elevated Temperature-Induced Degradation in Silicon Wafers Using Hydrogen Effusion Mass Spectroscopy
Author:
Affiliation:
1. Fraunhofer Center for Silicon Photovoltaics CSP, Halle, Germany
2. School of Photovoltaic and Renewable Energy Engineering, University of New South Wales, Sydney, NSW, Australia
3. Denkweit GmbH, Halle, Germany
Funder
Fraunhofer Center for Silicon Photovoltaics CSP
NexTec-Wafer
Australian Renewable Energy Agency
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Condensed Matter Physics,Electronic, Optical and Magnetic Materials
Link
http://xplorestaging.ieee.org/ielx7/5503869/9581323/09531995.pdf?arnumber=9531995
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