Author:
Kimura K.,Itoh K.,Hori R.,Etoh J.,Kawajiri Y.,Kawamoto H.,Sato K.,Matsumoto T.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering
Cited by
24 articles.
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1. History of junction technologies Commemorative talk for the 75th anniversary of the transistor;2023 21st International Workshop on Junction Technology (IWJT);2023-06-08
2. Highly Reliable Power Aware Memory Design;13th IEEE International On-Line Testing Symposium (IOLTS 2007);2007-07
3. Improved decoding algorithm for high reliable reed muller coding;2007 IEEE International SOC Conference;2007
4. LPRAM: A Novel Low-Power High-Performance RAM Design With Testability and Scalability;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2004-05
5. Energy-aware design of embedded memories;ACM Transactions on Embedded Computing Systems;2003-02