Author:
Sai-Halasz G.A.,Wordeman M.R.,Dennard R.H.
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
69 articles.
订阅此论文施引文献
订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Scaling Trends of Digital Single-Event Effects: A Survey of SEU and SET Parameters and Comparison With Transistor Performance;IEEE Transactions on Nuclear Science;2021-02
2. Radiation‐Induced Single Events;Integrated Circuit Design for Radiation Environments;2019-12-06
3. Radiation-Induced Soft Errors;VLSI Design and Test for Systems Dependability;2018-07-21
4. Manufacturing Threats;Dependable Multicore Architectures at Nanoscale;2017-08-30
5. Shield: A Reliable Network-on-Chip Router Architecture for Chip Multiprocessors;IEEE Transactions on Parallel and Distributed Systems;2016-10-01