A dual-gate deep-depletion technique for generation lifetime measurement-Reference-Cited by-同舟云学术

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A dual-gate deep-depletion technique for generation lifetime measurement

Published:1980-12 Issue:12 Volume:27 Page:2252-2255
ISSN:0018-9383
Container-title:IEEE Transactions on Electron Devices
language:
Short-container-title:IEEE Trans. Electron Devices

Author:

Barth P.W.,Angell J.B.

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/16/31809/01481052.pdf?arnumber=1481052

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