Correlation Between Whisker Initiation and Compressive Stress in Electrodeposited Tin–Copper Coating on Copper Leadframes-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Correlation Between Whisker Initiation and Compressive Stress in Electrodeposited Tin–Copper Coating on Copper Leadframes

Published:2010-07 Issue:3 Volume:33 Page:165-176
ISSN:1521-334X
Container-title:IEEE Transactions on Electronics Packaging Manufacturing
language:
Short-container-title:IEEE Trans. Electron. Packag. Manufact.

Author:

Kato Takahiko,Akahoshi Haruo,Nakamura Masato,Terasaki Takeshi,Iwasaki Tomio,Hashimoto Tomoaki,Nishimura Asao

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Industrial and Manufacturing Engineering

Link

http://xplorestaging.ieee.org/ielx5/6104/5547553/05438882.pdf?arnumber=5438882

Cited by 19 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Chemistry of Li-air batteries;Comprehensive Inorganic Chemistry III;2023

2. Effects of Interrupting the Contiguous Sn Thin-Film Network in Whiskering;IEEE Transactions on Components, Packaging and Manufacturing Technology;2021-12

3. The Influence of Limitation of Sputtered Tin Area Through Mesh Grids on Sn Whiskering;2020 IEEE 66th Holm Conference on Electrical Contacts and Intensive Course (HLM);2020-09-30

4. Nucleation and shrinkage of defects on the surface of tin induced by local strain distribution;Microelectronics Reliability;2017-12

5. Characterization Techniques for Film Characteristics;Mitigating Tin Whisker Risks;2016-04-29

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP