Author:
Cho Young Hoon,Seok Jinwuk,Kim Jeong-Si
Funder
Institute for Information communications Technology Planning Evaluation (IITP)
Cited by
1 articles.
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1. A Few-shot Learning Method for the Defect Inspection of Lithium Battery Sealing Nails;Proceedings of the 2023 4th International Conference on Computing, Networks and Internet of Things;2023-05-26