Combining Feature Correspondence With Parametric Chamfer Alignment: Hybrid Two-Stage Registration for Ultra-Widefield Retinal Images-Reference-Cited by-同舟云学术

Combining Feature Correspondence With Parametric Chamfer Alignment: Hybrid Two-Stage Registration for Ultra-Widefield Retinal Images

Author:

Ding Li¹^ORCID,Kang Tony D.²,Kuriyan Ajay E.³,Ramchandran Rajeev S.²^ORCID,Wykoff Charles C.⁴,Sharma Gaurav⁵^ORCID

Affiliation:

1. Department of Electrical and Computer Engineering, University of Rochester, USA

2. Department of Ophthalmology, Flaum Eye Institute at University of Rochester Medical Center, University of Rochester, USA

3. Mid Atlantic Retina, Retina Service of Wills Eye Hospital, Thomas Jefferson University, USA

4. Retina Consultants of Texas and Blanton Eye Institute, Houston Methodist Hospital and Weill Cornell Medical College, USA

5. Department of Electrical and Computer Engineering, University of Rochester, Rochester, NY, USA

Funder

University of Rochester Research Award

New York state funded Rochester Center of Excellence in Data Science

University of Rochester

National Institutes of Health

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Biomedical Engineering

Link

Reference49 articles.

5. Parametric correspondence and chamfer matching: Two new techniques for image matching;barrow;Proc Int Joint Conf Artif Intell,0

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