Yield optimization using k-means clustering algorithm to reduce Monte Carlo simulations-Reference-Cited by-同舟云学术

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Yield optimization using k-means clustering algorithm to reduce Monte Carlo simulations

Published:2016-06 Issue: Volume: Page:
ISSN:
Container-title:2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
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Author:

Canelas Antonio,Martins Ricardo,Povoa Ricardo,Lourenco Nuno,Horta Nuno

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7513177/7520642/07520729.pdf?arnumber=7520729

Cited by 4 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Research on deviation assessment regulation of load aggregator participating in power grid dynamic balance;2021 IEEE 4th International Conference on Automation, Electronics and Electrical Engineering (AUTEEE);2021-11-19

3. Tests and Results;Yield-Aware Analog IC Design and Optimization in Nanometer-scale Technologies;2020

4. Design Optimization and Results;A New Family of CMOS Cascode-Free Amplifiers with High Energy-Efficiency and Improved Gain;2018-08-11

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