Finite difference method for electromigration analysis of multi-branch interconnects-Reference-Cited by-同舟云学术

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Finite difference method for electromigration analysis of multi-branch interconnects

Published:2016-06 Issue: Volume: Page:
ISSN:
Container-title:2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD)
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Author:

Cook Chase,Sun Zeyu,Kim Taeyoung,Tan Sheldon X.-D.

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/7513177/7520642/07520752.pdf?arnumber=7520752

Cited by 6 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Fast Electromigration Stress Evolution Analysis Based on Relative Gain Array;2024 2nd International Symposium of Electronics Design Automation (ISEDA);2024-05-10

2. Fast Estimation for Electromigration Nucleation Time Based on Random Activation Energy Model;2024 Design, Automation & Test in Europe Conference & Exhibition (DATE);2024-03-25

3. Linear Time Electromigration Analysis Based on Physics-Informed Sparse Regression;IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems;2023-11

4. EM Lifetime Constrained Optimization for Multi-Segment Power Grid Networks;Dependable Embedded Systems;2020-12-10

5. Fast Electromigration Stress Evolution Analysis for Interconnect Trees Using Krylov Subspace Method;IEEE Transactions on Very Large Scale Integration (VLSI) Systems;2018-05

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