Author:
Nunez J.,Roca E.,Castro-Lopez R.,Martin-Martinez J.,Rodriguez R.,Nafria M.,Fernandez F.V.
Cited by
3 articles.
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1. Reliability evaluation of IC Ring Oscillator PUFs;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03
2. A Test Module for Aging Characterization of Digital Circuits;2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD);2023-07-03
3. Characterizing BTI and HCD in 1.2V 65nm CMOS Oscillators made from Combinational Standard Cells and Processor Logic Paths;2023 IEEE International Reliability Physics Symposium (IRPS);2023-03