Common Mode Noise Analysis inside the Integrated Circuits-Reference-Cited by-同舟云学术

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Common Mode Noise Analysis inside the Integrated Circuits

Published:2023-10-20 Issue: Volume: Page:
ISSN:
Container-title:2023 IEEE 7th International Symposium on Electromagnetic Compatibility (ISEMC)
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Author:

Long Faming¹,Zhang Li²,Jia Liwei³,Zhang Jiangtao⁴,Yu Bin²,Xie Yelei¹

Affiliation:

1. ZTE Corporation,State Key Laboratory of Mobile Network and Mobile Multimedia Technology,Nan Jing,China

2. ZTE Corporation,State Key Laboratory of Mobile Network and Mobile Multimedia Technology,Shen Zhen,China

3. Liwei Jia Sanechinps Technology co.,LTD,Cheng du,China

4. ZTE Corporation,State Key Laboratory of Mobile Network and Mobile Multimedia Technology,Xi'an,China

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10370006/10368602/10370278.pdf?arnumber=10370278

Reference9 articles.

1. Black-Box DC-DC Integrated Circuit Modeling towards Design for EMC in Automotive Electronics

2. A comparison of the contributions of common-mode and differential-mode currents in radiated emissions

3. A Novel Wideband Common-Mode Suppression Filter for Gigahertz Differential Signals Using Coupled Patterned Ground Structure

4. Advanced Signal Integrity for High-Speed Digital Designs

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