Crystal Quality Effect on Low-Frequency Noise in ZnO TFTs-Reference-Cited by-同舟云学术

登录注册会员服务联系我们

Crystal Quality Effect on Low-Frequency Noise in ZnO TFTs

Published:2011-12 Issue:12 Volume:32 Page:1701-1703
ISSN:0741-3106
Container-title:IEEE Electron Device Letters
language:
Short-container-title:IEEE Electron Device Lett.

Author:

Jeong Kwang-Seok,Kim Yu-Mi,Yun Ho-Jin,Yang Seung-Dong,Kim Young-Su,Kang Min-Ho,Lee Hi-Deok,Lee Ga-Won

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx5/55/6079317/06042354.pdf?arnumber=6042354

Cited by 21 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Nanoscale Mapping of Carrier Mobilities in the Ballistic Transports of Carbon Nanotube Networks;ACS Nano;2022-11-17

2. Evaluation of Positive-Bias-Stress-Induced Degradation in InSnZnO Thin-Film Transistors by Low Frequency Noise Measurement;IEEE Electron Device Letters;2022-06

3. Comparison of the characteristics of semiconductor gas sensors with different transducers fabricated on the same substrate;Sensors and Actuators B: Chemical;2021-05

4. Low frequency noise characteristics of resistor- and Si MOSFET-type gas sensors fabricated on the same Si wafer with In2O3 sensing layer;Sensors and Actuators B: Chemical;2020-09

5. Dimension Scaling Effects on Conduction and Low Frequency Noise Characteristics of ITO-Stabilized ZnO Thin Film Transistors;IEEE Journal of the Electron Devices Society;2020

同舟云学术

1.学者识别学者识别

2.学术分析学术分析

3.人才评估人才评估

"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370

www.globalauthorid.com

TOP