MC/DC Test Case Automatic Generation for Safety-Critical Systems-Reference-Cited by-同舟云学术

MC/DC Test Case Automatic Generation for Safety-Critical Systems

Published:2022-12 Issue: Volume: Page:
ISSN:
Container-title:2022 IEEE 22nd International Conference on Software Quality, Reliability and Security (QRS)
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Author:

Wang Cong¹,Sun Haiying²,Dou Hui³,Chen Hongtao³,Liu Jing¹

Affiliation:

1. East China Normal University,Shanghai Key Laboratory of Trustworthy Computing,Shanghai,China

2. East China Normal University,Software Engineering Institute,Shanghai,China

3. Huawei Technology,Shanghai,China

Funder

Research and Development

Publisher

IEEE

Link

http://xplorestaging.ieee.org/ielx7/10061851/10061812/10062469.pdf?arnumber=10062469

Reference25 articles.

1. An mde-based approach to the verification of sysml state machine diagram;xiaopu;Proceedings of the Fourth Asia-Pacific Symposium on Internetware,2012

2. A Formalisation of SysML State Machines in mCRL2

3. Reasonability of MC/DC for safety-relevant software implemented in programming languages with short-circuit evaluation

4. Towards a Formal Operational Semantics of UML Statechart Diagrams

5. Applying systems modeling language in an aviation maintenance system;elakramine;IEEE Transactions on Engineering Management,2021

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