Author:
Shih Ching-Kuei,Liao Chih-Cherng,Nidhi Karuna,Kan Kai-Chuan,Chen Ke-Horng,Lee Jian-Hsing
Cited by
1 articles.
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1. Physical Insights Into the ESD Behavior of Field Plated UHV LDMOS Devices;2022 IEEE International Conference on Emerging Electronics (ICEE);2022-12-11