Funder
CSIR for granting the Junior Research Fellowship
DST, India, through the Inspire Faculty Award
Physical Property Measurement System (PPMS) measurements
Scanning electron microscope (SEM) measurements, and K. Mohan for transmission electron microscopy (TEM) measurements
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials
Cited by
1 articles.
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