Noise Characterization of Perpendicular Recording Media by Cluster Size Measurements-Reference-Cited by-同舟云学术

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Noise Characterization of Perpendicular Recording Media by Cluster Size Measurements

Published:2014-05 Issue:5 Volume:50 Page:1-6
ISSN:0018-9464
Container-title:IEEE Transactions on Magnetics
language:
Short-container-title:IEEE Trans. Magn.

Author:

Varghese Binni,Piramanayagam S. N.,Wee Kiat Lee ,Hang Khume Tan

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

Subject

Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials

Link

http://xplorestaging.ieee.org/ielx7/20/6810853/06678788.pdf?arnumber=6678788

Cited by 7 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

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2. Surface Characterization Techniques;Surface Treatments for Biological, Chemical, and Physical Applications;2016-11-18

3. Model of advanced recording media: The angular dependence of the coercivity including the effect of exchange interaction;Journal of Applied Physics;2016-02-14

4. Dependence of domain structure on applied field direction in stacked media;Journal of Applied Physics;2015-05-07

5. Higher Resolution Scanning Probe Methods for Magnetic Imaging;Surface Science Tools for Nanomaterials Characterization;2015

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