Photon Counting Histogram Expectation Maximization Algorithm for Characterization of Deep Sub-Electron Read Noise Sensors
Author:
Affiliation:
1. U.S. Navy, NAWCAD DAiTA Group, Patuxent River, MD, USA
2. U.S. Army, C51SR Center, Fort Belvoir, VA, USA
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Subject
Electrical and Electronic Engineering,Electronic, Optical and Magnetic Materials,Biotechnology
Link
http://xplorestaging.ieee.org/ielx7/6245494/10049274/10164647.pdf?arnumber=10164647
Reference15 articles.
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